Circuit reliability has become a growing concern in today�s nanoelectronics, which motivates strong research interest over the\nyears in reliability analysis and reliability-oriented circuit design. While quite a few approaches for circuit reliability analysis have\nbeen reported, there is a lack of comparative studies on their pros and cons in terms of both accuracy and efficiency. This paper\nprovides an overview of some typical methods for reliability analysis with focus on gate-level circuits, large or small, with or without\nreconvergent fanouts. It is intended to help the readers gain an insight into the reliability issues, and their complexity as well as\noptional solutions.Understanding the reliability analysis is also a first step towards advanced circuit designs for improved reliability\nin the future research.
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