Noncontact atomic force microscopy provides access to several complementary signals, such as topography, damping, and contact\r\npotential. The traditional presentation of such data sets in adjacent figures or in colour-coded pseudo-three-dimensional plots gives\r\nonly a qualitative impression. We introduce two-dimensional histograms for the representation of multichannel NC-AFM data sets\r\nin a quantitative fashion. Presentation and analysis are exemplified for topography and contact-potential data for graphene grown\r\nepitaxially on 6H-SiC(0001), as recorded by Kelvin probe force microscopy in ultrahigh vacuum. Sample preparations by thermal\r\ndecomposition in ultrahigh vacuum and in an argon atmosphere are compared and the respective growth mechanisms discussed.
Loading....