We present a novel method to model the tracking behavior of semiconductor transistors undergoing across-chip variations in a\r\ncompactMonte Carlo model for SPICE simulations and showan enablement of simultaneousN(N-1)/2 tracking relations among\r\nN transistors on a chip at any poly density, any gate pitch, and any physical location for the first time. At smaller separations,\r\nour modeled tracking relation versus physical location reduces to Pelgrom�s characterization on device�s distance-dependent\r\nmismatch. Our method is very compact, since we do not use a matrix or a set of eigen solutions to represent correlations among\r\nN transistors.
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