For the first time the effect of light on the CVC of strained p-n-junction in a strong microwave field\nis examined. It is shown that the deformation and the microwave field increase the current\nthrough p-n-junction, and the light decreases it. The mechanism of this phenomenon is explained\nby the fact that under heating of the charge carriers by microwave field the recombination current\narises, and under the action of light the generation current arises which are directed oppositely.\nAnd under the influence of the deformation the band gap of the semiconductor will be changed.
Loading....