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Inventi Impact: Optical Technologies

Articles

  • Inventi:eot/32135/20
    Ultrahigh Resolution Thickness Measurement Technique Based on a Hollow Core Optical Fiber Structure
    Research 2020 : July - September
    Zheyu Wu, Bin Liu, Jiangfeng Zhu, Juan Liu, Shengpeng Wan, Tao Wu, Jinghua Sun

    An ultrahigh resolution thickness measurement sensor was proposed based on a single\nmodeâ??hollow coreâ??single mode (SMFâ??HCFâ??SMF) fiber structure by coating a thin layer of material\non the HCF surface...................

    How to Cite this Article
    Attribution/ CC Compliant Citation: Wu, Zheyu, et al. \"Ultrahigh Resolution Thickness Measurement Technique Based\non a Hollow Core Optical Fiber Structure.\" Sensors 20.7 (2020): 2035.\nhttps://doi:10.3390/s20072035\nhttp://creativecommons.org/licenses/by/4.0/\n\nSome formatting elements, header, footer, logos, dates and pagination were modified while adapting this article.
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